Lab and Coral NameNANO / Microscope-QuickVision
ModelMitutoyo Quick Vision Active 202
SpecialistTimothy Turner    (Daniel A. Adams)
Physical LocationLv5
Process CategoryPackaging
SubcategoryPhysical, LEAP
Material KeywordsNone
Sample Size8" Wafers, 6" Wafers, 4" Wafers, 7" Photo Plates, 5" Photo Plates, Pieces
Keywordsmanual load, alignment
Mitutoyo Quick Vision Active Series CNC Vision Measuring System. Combines the flexibility of multiple high-quality zoom lenses with features: High-quality zoom optics with interchangeable lenses, High-resolution and high-speed color camera, QVPAK 3D vision software, contact and noncontact measurement, programmable LED stage, coaxial, and 4-quadrant ring light. Range (X,Y,Z-axis) with vision head 250 x 200 x 150 mm. Resolution 0.1 Ám. Accuracy 0.2 Ám. Illumination: white LED / contour / coaxial / 4-quadrant ring light. Zoom optical system with 8 positions. High-resolution CMOS color camera. Objective lenses: 1X and 2X magnification.

Best forAutomated imaging of larger surfaces, including pattern recognition. Taking and saving images within seconds
Caution with
Machine Charges (academic rate)3pu/hour
Process Matrix Details

Been in the ALDSamples that have been in any of the ALD systems
Pyrex SubstratesPyrex substrates can be a concern due to high sodium content, which contaminates CMOS frontend tools
III-V SubstratesAny III-V substrates, e.g. GaAs, GaN, InP, and so on. Note though that many common III-V substrates will also carry the Au flag, but there are some GREEN III-V substrates.
Germanium on surfaceSamples with germanium on the surface (typically grown films)
Germanium buriedSamples with germanium buried below a different film
PiecesWafer pieces may not be handled by the equipment, and are harder to thoroughly clean - preventing them from running in certain tools.
Gold or RED color codeRED color code substrates. These are gold-contaminated or have been processed in gold contaminated tools. Gold and other metals can contaminate silicon devices (GREEN color code) and have to be separated.
Any exposure to CMOS metalIf the sample had ever seen a CMOS metal (or a tool that accepts CMOS metal), then some frontend tools could be contaminated by this.
CMOS metal on surfaceCMOS compatible metals exposed on the surface. These are Al,Ni,Pt,Ti,TiN. Other metals such as Au are *NOT* part of this.
CMOS metal buriedCMOS compatible metals covered entirely by a different material. These are Al,Ni,Pt,Ti,TiN. Other metals such as Au are *NOT* part of this.
Been in the STS DRIEThe DRIE etch leaves behind polymer residues on the sidewall ripples, which can be a contamination concern for some tools.
Been in the SEMA sample viewed in the SEM must have used the appropriate chuck to avoid cross-contamination
Been in the Concept1The Concep1 deposits dielectrics on GREEN wafers, however it also accepts metal and there can be cross-contamination for diffusion area
Has PhotoresistSamples with photoresist cannot be exposed to high temperatures, which is typical in deposition tools. Outgassing can be a concern.
Has PolyimidePolyimide is a very chemically resistant polymer, and can tolerate higher temperatures but cannot be exposed to typical PECVD deposition temperatures or diffusion furnaces. Outgassing can be a concern.
Has Cured SU8Not fully cured SU8 residues can heavily contaminated plasma chambers or destroy other user's samples, but fully cured SU8 is permitted in certain tools.
Coming from KOHAfter a KOH etch, the samples must receive a special clean because the K ions are highly contaminating to CMOS frontend tools
Coming from CMPAfter a CMP, the samples must receive a special clean, because the slurry residues otherwise introduce contamination and particles.

Not Allowed
Ever been in EMLSamples from EML are never permitted to return to ICL or TRL

For more details or help, please consult PTC matrix, email, or ask the research specialist (Timothy Turner)